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Total no. 231 |
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1 | Utpal S. Joshi, "Resistive Random Access Memory Effects in Oxide based planar and MIM structures : Properties and Mechanisms," Invited Talk in the DAE-BRNS 5th National Symposium on Pulsed Laser Deposition of Thin films and Nanostructured Materials (PLD 2009), Indian Institute of Technology-Madras, Chennai, 02-04 December 2009. |
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2 | Pallavi Shahapurkar and R. S. Pande, "Reliability characterization of RF MEMS Cantilever switch," in Int. Conf. ITECH-09, Sangamner, pp. 82, 2009. |
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3 | Divya Shrivastava, Deepak Khushalani, Pallavi Shahapurkar, Nikhil Muley, Jayu Kalambe and R. S. Pande, "Reliability of RF-MEMS Switch," in 51st Nat. Seminar on Industrial Productivity, Safety and Disaster Management, Nagpur, 2009. |
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4 | B.V. Mistry, K. H. Bhavsar, U. N. Trivedi, Mrinmoy Mandal, R. Pinto and U. S. Joshi, "Electrical switching properties of Ag/In2O3/LaNiO3 thin film nanostructures," in 5th DAE-BRNS Nat. Symposium on Pulsed Laser Deposition of Nanomaterials and Nanostructures, Proc. of the PLD-2009, Chennai, 2009. |
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5 | Shibesh Dutta, Sivaramakrishnan, Sundar Gopalan and Balakrishnan Shankar, "Electrical characterization and reliability analysis of HfO2-TiO2-Al MOSCAPs," in World Academy of Science, Engineering & Technology. Vol. 58, October Article 19, 2009. |
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6 | S. K. Lahiri, H. Saha and A. Kundu, "RF MEMS SWITCH: An overview at- a glance," in Proc. Int. Conf. on Computers and Devices for Comm.(CODEC), Kharagpur, 2009.
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7 | Rashmi and R. M. Patrikar, "Simulation of Nanostructure Floating Gate Asymmetric Channel EEPROM Cells," in Proc. of XV Int. workshop on Physics of semiconductor Devices (IWPSD), New Delhi, 2009. |
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